Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference31 articles.
1. The theoretical resolution limit of the electron microscope;Scherzer;Journal of Applied Physics,1949
2. Advanced Computing in Electron Microscopy;Kirkland,2010
3. Die strahlenschädigung der objekte als grenze für die hochauflösende elektronenmikroskopie;Scherzer;Berichte der Bunsen-Gesellschaft für Physikalische Chemie,1970
4. On the importance of fifth-order spherical aberration for fully corrected electron microscopy;Chang;Ultramicroscopy,2006
5. Contrast transfer and resolution limits for sub-angstrom high-resolution transmission electron microscopy;Lentzen;Microscopy and Microanalysis,2008
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