Nanoscale spectroscopy with polarized X-rays by NEXAFS-TXM-Reference-Cited by-同舟云学术

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Nanoscale spectroscopy with polarized X-rays by NEXAFS-TXM

Published:2011-11-27 Issue:1 Volume:6 Page:25-29
ISSN:1749-4885
Container-title:Nature Photonics
language:en
Short-container-title:Nature Photon

Author:

Guttmann Peter,Bittencourt Carla,Rehbein Stefan,Umek Polona,Ke Xiaoxing,Van Tendeloo Gustaaf,Ewels Chris P.,Schneider Gerd

Publisher

Springer Science and Business Media LLC

Subject

Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

http://www.nature.com/articles/nphoton.2011.268.pdf

Reference30 articles.

1. Ade, H. & Hitchcock, A. P. NEXAFS microscopy and resonant scattering: composition and orientation probed in real and reciprocal space. Polymer 49, 643–675 (2008).

2. Najafi, E. et al. Polarization dependence of the C 1s X-ray absorption spectra of individual multi-walled carbon nanotubes. Small 4, 2279–2285 (2008).

3. Felten, A. et al. Individual multiwall carbon nanotubes spectroscopy by scanning transmission X-ray microscopy. Nano Lett. 7, 2435–2440 (2007).

4. Sasaki, T. et al. Performance of low-voltage STEM/TEM with delta corrector and cold field emission gun. J. Electron. Microsc. 59, S7–S13 (2010).

5. Suenaga, K. & Koshino, M. Atom-by-atom spectroscopy at graphene edge. Nature 468, 1088–1090 (2010).

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