Characterization of nanoscale temperature fields during electromigration of nanowires
Author:
Publisher
Springer Science and Business Media LLC
Subject
Multidisciplinary
Link
http://www.nature.com/articles/srep04975.pdf
Reference34 articles.
1. Lee, W. et al. Heat dissipation in atomic-scale junctions. Nature 498, 209 (2013).
2. Costa, P. M. F. J., Gautam, U. K., Bando, Y. & Golberg, D. Direct imaging of Joule heating dynamics and temperature profiling inside a carbon nanotube interconnect. Nat. Commun. 2, 421 (2011).
3. Seol, J. H. et al. Two-Dimensional Phonon Transport in Supported Graphene. Science 328, 213–216 (2010).
4. Tao, C. G., Cullen, W. G. & Williams, E. D. Visualizing the Electron Scattering Force in Nanostructures. Science 328, 736–740 (2010).
5. Nam, S. W. et al. Electrical Wind Force-Driven and Dislocation-Templated Amorphization in Phase-Change Nanowires. Science 336, 1561–1566 (2012).
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