Author:
Li Yuling,Huang Yuxi,Liu Xiaohua,Wang Yaqin,Yuan Le
Abstract
AbstractThe two-dimensional electron gas (2DEG) in BaSnO$$_3$$
3
-based heterostructure (HS) has received tremendous attention in the electronic applications because of its excellent electron migration characteristic. We modeled the n-type (LaO)$$^+$$
+
/(SnO$$_2$$
2
)$$^0$$
0
interface by depositing LaGaO$$_3$$
3
film on the BaSnO$$_3$$
3
substrate and explored strain effects on the critical thickness for forming 2DEG and electrical properties of LaGaO$$_3$$
3
/BaSnO$$_3$$
3
HS system using first-principles electronic structure calculations. The results indicate that to form 2DEG in the unstrained LaGaO$$_3$$
3
/BaSnO$$_3$$
3
HS system, a minimum thickness of approximately 4 unit cells of LaGaO$$_3$$
3
film is necessary. An increased film thickness of LaGaO$$_3$$
3
is required to form the 2DEG for -3%-biaxially-strained HS system and the critical thickness is 3 unit cells for 3%-baxially-strained HS system, which is caused by the strain-induced change of the electrostatic potential in LaGaO$$_3$$
3
film. In addition, the biaxial strain plays an important role in tailoring the electrical properties of 2DEG in LaGaO$$_3$$
3
/BaSnO$$_3$$
3
HS syestem. The interfacial charge carrier density, electron mobility and electrical conductivity can be optimized when a moderate tensile strain is applied on the BaSnO$$_3$$
3
substrate in the ab-plane.
Funder
National Natural Science Foundation of China
Publisher
Springer Science and Business Media LLC