Fundamental and experimental aspects of diffraction for characterizing dislocations by electron channeling contrast imaging in scanning electron microscope-Reference-Cited by-同舟云学术

Fundamental and experimental aspects of diffraction for characterizing dislocations by electron channeling contrast imaging in scanning electron microscope

Published:2017-08-29 Issue:1 Volume:7 Page:
ISSN:2045-2322
Container-title:Scientific Reports
language:en
Short-container-title:Sci Rep

Author:

Kriaa H.,Guitton A.,Maloufi N.

Publisher

Springer Science and Business Media LLC

Subject

Multidisciplinary

Link

http://www.nature.com/articles/s41598-017-09756-3.pdf

Reference24 articles.

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3. Morin, P., Pitaval, M., Vucario, E. & Fontaine, G. Scanning electron microscope observation of single defects in solid crystalline materials. Scanning. 2, 217–224 (1979).

4. Morin, P., Pitaval, M., Besnard, D. & Fontaine, G. Electron–channeling imaging in scanning electron microscopy. Philos. Mag. 40(4), 511–524 (1979).

5. Wilkinson, A., Anstis, G. R., Czernuszka, J. T., Long, N. J. & Hirsch, P. B. Electron channeling contrast imaging of interfacial defects in strained silicon germanium layers on silicon. Philos. Mag. 68, 59–80 (1993).

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