Author:
Alonso-Mori Roberto,Sokaras Dimosthenis,Cammarata Marco,Ding Yuantao,Feng Yiping,Fritz David,Gaffney Kelly J.,Hastings Jerome,Kao Chi-Chang,Lemke Henrik T.,Maxwell Timothy,Robert Aymeric,Schropp Andreas,Seiboth Frank,Sikorski Marcin,Song Sanghoon,Weng Tsu-Chien,Zhang Wenkai,Glenzer Siegfried,Bergmann Uwe,Zhu Diling
Abstract
AbstractWe report the time-resolved femtosecond evolution of the K-shell X-ray emission spectra of iron during high intensity illumination of X-rays in a micron-sized focused hard X-ray free electron laser (XFEL) beam. Detailed pulse length dependent measurements revealed that rapid spectral energy shift and broadening started within the first 10 fs of the X-ray illumination at intensity levels between 1017 and 1018 W cm-2. We attribute these spectral changes to the rapid evolution of high-density photoelectron mediated secondary collisional ionization processes upon the absorption of the incident XFEL radiation. These fast electronic processes, occurring at timescales well within the typical XFEL pulse durations (i.e., tens of fs), set the boundary conditions of the pulse intensity and sample parameters where the widely-accepted ‘probe-before-destroy’ measurement strategy can be adopted for electronic-structure related XFEL experiments.
Publisher
Springer Science and Business Media LLC
Cited by
18 articles.
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