Probing spatial heterogeneity in silicon thin films by Raman spectroscopy-Reference-Cited by-同舟云学术

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Probing spatial heterogeneity in silicon thin films by Raman spectroscopy

Published:2017-11-29 Issue:1 Volume:7 Page:
ISSN:2045-2322
Container-title:Scientific Reports
language:en
Short-container-title:Sci Rep

Author:

Yamazaki Hideyuki,Koike Mitsuo,Saitoh Masumi,Tomita Mitsuhiro,Yokogawa Ryo,Sawamoto Naomi,Tomita Motohiro,Kosemura Daisuke,Ogura Atsushi

Publisher

Springer Science and Business Media LLC

Subject

Multidisciplinary

Link

http://www.nature.com/articles/s41598-017-16724-4.pdf

Reference27 articles.

1. Priolo, F., Gregorkiewicz, T., Galli, M. & Krauss, T. F. Silicon nanostructures for photonics and photovoltaics. Nature Nanotech. 9, 19–32 (2014).

2. Heitmann, J., Müller, F., Zacharias, M. & Gösele, U. Silicon nanocrystals: Size matters. Adv. Mater. 17, 795–803 (2005).

3. Künle, M. et al. Si-rich a-SiC:H thin films: structural and optical transformations during thermal annealing. Thin Solid Films 519, 151–157 (2010).

4. Sun, W. et al. Switching-on quantum size effects in silicon nanocrystals. Adv. Mater. 27, 746–749 (2015).

5. Puthen-Veettil, B., Patterson, R., König, D., Conibeer, G. & Green, M. A. The impact of disorder on charge transport in three dimensional quantum dot resonant tunneling structures. J. Appl. Phys. 116, 163707 (2014).

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3. Structural analysis of sputtered amorphous silica thin films: A Raman spectroscopy investigation;Thin Solid Films;2021-09

4. Thermal conductivity characteristics in polycrystalline silicon with different average sizes of grain and nanostructures in the grains by UV Raman spectroscopy;Japanese Journal of Applied Physics;2020-06-10

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