Confocal photoluminescence investigation to identify basal stacking fault’s role in the optical properties of semi-polar InGaN/GaN lighting emitting diodes
Author:
Funder
RCUK | Engineering and Physical Sciences Research Council
Publisher
Springer Science and Business Media LLC
Subject
Multidisciplinary
Link
http://www.nature.com/articles/s41598-019-46292-8.pdf
Reference25 articles.
1. Auf der Maur, M., Pecchia, A., Penazzi, G., Rodrigues, W. & Di Carlo, A. Efficiency Drop in Green InGaN/GaN Light Emitting Diodes: The Role of Random Alloy Fluctuations. Phys. Rev. Lett. 116(2), 027401 (2016).
2. Rajbhandari, S. et al. A Review of Gallium Nitride LEDs for Multi-Gigabit-per-Second Visible Light Data Communications. Semicond. Sci. Technol. 32(2), 023001 (2017).
3. Funato, M. et al. Weak Carrier/Exciton Localization in InGaN Quantum Wells for Green Laser Diodes Fabricated on Semi-Polar {20–21} GaN Substrates. Appl. Phys. Express 3(2), 021002 (2010).
4. Liu, B. et al. Temporally and Spatially Resolved Photoluminescence Investigation of (11–22) Semi-Polar InGaN/GaN Multiple Quantum Wells Grown on Nanorod Templates. Appl. Phys. Lett. 105(26), 261103 (2014).
5. Funato, M. & Kawakami, Y. Excitonic Properties of Polar, Semipolar, and Nonpolar InGaN∕GaN Strained Quantum Wells with Potential Fluctuations. J. Appl. Phys. 103(9), 093501 (2008).
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