Non-destructive detection of cross-sectional strain and defect structure in an individual Ag five-fold twinned nanowire by 3D electron diffraction mapping-Reference-Cited by-同舟云学术

Non-destructive detection of cross-sectional strain and defect structure in an individual Ag five-fold twinned nanowire by 3D electron diffraction mapping

Published:2017-07-24 Issue:1 Volume:7 Page:
ISSN:2045-2322
Container-title:Scientific Reports
language:en
Short-container-title:Sci Rep

Author:

Fu Xin,Yuan Jun^ORCID

Publisher

Springer Science and Business Media LLC

Subject

Multidisciplinary

Link

http://www.nature.com/articles/s41598-017-06485-5.pdf

Reference55 articles.

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3. Dai, S. et al. Elastic properties of GaN nanowires: revealing the influence of planar defects on Young’s modulus at nanoscale. Nano Lett. 15, 8–15 (2015).

4. Narayanan, S., Cheng, G., Zeng, Z., Zhu, Y. & Zhu, T. Strain hardening and size effect in five-fold twinned Ag nanowires. Nano Lett. 15, 4037–4044 (2015).

5. Nam, D. et al. Strain-induced pseudoheterostructure nanowires confining carriers at room temperature with nanoscale-tunable band profiles. Nano Lett. 13, 3118–3123 (2013).

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