Exploring the degradation of silver nanowire networks under thermal stress by coupling <i>in situ</i> X-ray diffraction and electrical resistance measurements-Reference-Cited by-同舟云学术

Exploring the degradation of silver nanowire networks under thermal stress by coupling in situ X-ray diffraction and electrical resistance measurements

Published:2024 Issue:2 Volume:16 Page:564-579
ISSN:2040-3364
Container-title:Nanoscale
language:en
Short-container-title:Nanoscale

Author:

Bardet Laetitia¹²^ORCID,Roussel Hervé¹,Saroglia Stefano¹,Akbari Masoud¹,Muñoz-Rojas David¹^ORCID,Jiménez Carmen¹^ORCID,Denneulin Aurore²,Bellet Daniel¹^ORCID

Affiliation:

1. Univ. Grenoble Alpes, CNRS, Grenoble INP, LMGP, F-38000, Grenoble, France

2. Univ. Grenoble Alpes, CNRS, Grenoble INP, LGP2, F-38000, Grenoble, France

Abstract

During the thermal ramp of a AgNW network, the XRD measurement is sensitive to the bulk of AgNW, whereas the electrical resistance is mainly influenced by AgNW junctions. This enables the observation of differences in thermal transition values.

Funder

Agence Nationale de la Recherche

Région Auvergne-Rhône-Alpes

LabEx CEMAM

Publisher

Royal Society of Chemistry (RSC)

Subject

General Materials Science

Link

http://pubs.rsc.org/en/content/articlepdf/2024/NR/D3NR02663A

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1. Transparent Heaters: A Review