Author:
Yang Zhanbing,Sakaguchi Norihito,Watanabe Seiichi,Kawai Masayoshi
Publisher
Springer Science and Business Media LLC
Reference29 articles.
1. Makin, M. J. Electron displacement damage in copper and aluminium in a high voltage electron microscope. Philos. Mag. 18, 637 653 (1968).
2. Kiritani, M., Yoshida, N., Takata, H. & Maehara, Y. Growth of interstitial type dislocation loops and vacancy mobility in electron irradiated metals. J. Phys. Soc. Jpn. 38, 1677 1686 (1975).
3. Kiritani, M. & Takata, H. Dynamic studies of defect mobility using high voltage electron microscopy. J. Nucl. Mater. 6970, 277 309 (1978).
4. Yoo, M. H. & Stiegler, J. O. Point defect interactions and growth of dislocation loops. J. Nucl. Mater. 6970, 813 815 (1978).
5. Abromeit, C. & Wollenberger, H. Insight into cascade processes arising from studies of cascade collapse. Mater. Sci. Forum 1518, 1003 1022 (1987).
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