Electron displacement damage in copper and aluminium in a high voltage electron microscope-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Electron displacement damage in copper and aluminium in a high voltage electron microscope

Published:1968-09 Issue:153 Volume:18 Page:637-653
ISSN:0031-8086
Container-title:Philosophical Magazine
language:en
Short-container-title:Philosophical Magazine

Author:

Makin M. J.

Publisher

Informa UK Limited

Link

http://www.tandfonline.com/doi/pdf/10.1080/14786436808227466

Reference13 articles.

1. XX. Some Ordering Effects inCu3Auat about100°c

2. Dynamics of Radiation Damage

3. Production Rates of Electrical Resistivity in Copper and Aluminum Induced by Electron Irradiation

4. The hardening of copper single crystals by electron irradiation

5. The formation of dislocation loops in copper during neutron irradiation

Cited by 159 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. An Integrated Solution to FIB-Induced Hydride Artifacts in Pure Zirconium;Micromachines;2024-08-01

2. Prediction of primary knock-on damage during electron microscopy characterization of lithium-containing materials;Ultramicroscopy;2024-02

3. In Situ TEM Characterization and Modulation for Phase Engineering of Nanomaterials;Chemical Reviews;2023-12-06

4. Atomic scale volume and grain boundary diffusion elucidated by in situ STEM;Nature Communications;2023-11-22

5. Progress in atomic-resolution aberration corrected conventional transmission electron microscopy (CTEM);Progress in Materials Science;2023-03

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3