Direct extraction of topological Zak phase with the synthetic dimension

Author:

Li GuangzhenORCID,Wang Luojia,Ye Rui,Zheng YuanlinORCID,Wang Da-WeiORCID,Liu Xiong-Jun,Dutt AvikORCID,Yuan LuqiORCID,Chen XianfengORCID

Abstract

AbstractMeasuring topological invariants is an essential task in characterizing topological phases of matter. They are usually obtained from the number of edge states due to the bulk-edge correspondence or from interference since they are integrals of the geometric phases in the energy band. It is commonly believed that the bulk band structures could not be directly used to obtain the topological invariants. Here, we implement the experimental extraction of Zak phase from the bulk band structures of a Su-Schrieffer-Heeger (SSH) model in the synthetic frequency dimension. Such synthetic SSH lattices are constructed in the frequency axis of light, by controlling the coupling strengths between the symmetric and antisymmetric supermodes of two bichromatically driven rings. We measure the transmission spectra and obtain the projection of the time-resolved band structure on lattice sites, where a strong contrast between the non-trivial and trivial topological phases is observed. The topological Zak phase is naturally encoded in the bulk band structures of the synthetic SSH lattices, which can hence be experimentally extracted from the transmission spectra in a fiber-based modulated ring platform using a laser with telecom wavelength. Our method of extracting topological phases from the bulk band structure can be further extended to characterize topological invariants in higher dimensions, while the exhibited trivial and non-trivial transmission spectra from the topological transition may find future applications in optical communications.

Funder

National Natural Science Foundation of China

National Key Research and Development Program of China

Shanghai Municipal Science and Technology Major Project

Publisher

Springer Science and Business Media LLC

Subject

Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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