Research on Steel Surface Defect Detection Algorithm Based on Improved Deep Learning

Author:

Ren Fei1,Wang GuangRong2,Hu ZhiQi3,Wu MinNing4,Devaraj Madhavi1

Affiliation:

1. School of Information Technology, Mapua University, Manila, Philippines

2. Sinoma (Nanjing) Mining Research Institute Co., Ltd, Nanjing, China

3. Sinoma Mining Construction Co., Ltd., Nanjing, China

4. School of Information Engineering, Yulin University, Yulin, Shaanxi

Abstract

With the development of industrial economy, more and more enterprises use machine vision and artificial intelligence to replace manual detection. Therefore, the research of steel surface defect detection based on artificial intelligence is of great significance to promote the rapid development of intelligent factory and intelligent manufacturing system. In this paper, Yolov5 deep learning algorithm is used to build a classification model of steel surface defects to realize the classification and detection of steel surface defects. At the same time, on the basis of Yolov5, combined with the attention mechanism, the backbone network is improved to further improve the classification model of steel surface defects. The experiment shows that the Recall and mAP of improved Yolov5 perform better on the steel surface defect data set. Compared with Yolov5, the number of C3CA-Yolov5 parameters decreased by 13.02%, and the size of pt files decreased by 12.72%; the number of C3ECA-Yolov5 parameters decreased by 13.36%, and the size of pt files decreased by 13.22%.

Publisher

FOREX Publication

Subject

Electrical and Electronic Engineering,Engineering (miscellaneous)

Reference18 articles.

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3. Li Ke, Wu Zhongqing, Ji Yong & Su Lei. (2022). Improving the detection method of weld bubble defect in u-net chip X-ray image Journal of Huazhong University of science and Technology (NATURAL SCIENCE EDITION) (06), 104-110. Doi: 10.13245/j.hust.220613.

4. Erozan Ahmet Turan and Bosse Simon and Tahoori Mehdi B. (2021). Defect Detection in Transparent Printed Electronics Using Learning-Based Optical Inspection. IEEE TRANSACTIONS ON VERY LARGE-SCALE INTEGRATION (VLSI) SYSTEMS, 29(8), pp. 1505-1517.

5. Kento Nakashima et al. (2021). Defect detection in wrap film product using compact convolutional neural network. Artificial Life and Robotics, 26(3), pp. 1-7.

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