Effects of Processing Conditions on the Work Function and Energy-Level Alignment of NiO Thin Films-Reference-Cited by-同舟云学术

Effects of Processing Conditions on the Work Function and Energy-Level Alignment of NiO Thin Films

Published:2010-11-02 Issue:46 Volume:114 Page:19777-19781
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Greiner Mark T.¹,Helander Michael G.¹,Wang Zhi-Bin¹,Tang Wing-Man¹,Lu Zheng-Hong¹

Affiliation:

1. Department of Materials Science and Engineering, University of Toronto, 184 College Street, Toronto, Ontario, Canada M5S 3E4, and Department of Physics, Yunnan University, 2 Cuihu Beilu, Yunnan, Kunming 650091, People’s Republic of China

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/jp108281m

Reference43 articles.

1. Improved performances of organic light-emitting diodes with metal oxide as anode buffer

2. Enhanced hole injection in organic light-emitting devices by using Fe3O4 as an anodic buffer layer

3. The role of molybdenum oxide as anode interfacial modification in the improvement of efficiency and stability in organic light-emitting diodes

4. A comparison of CuO and Cu2O hole-injection layers for low voltage organic devices

5. Transparent Inverted Organic Light-Emitting Diodes with a Tungsten Oxide Buffer Layer

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