Arrays of Densely Packed Isolated Nanowires by Focused Beam Induced Deposition Plus Ar+ Milling-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Arrays of Densely Packed Isolated Nanowires by Focused Beam Induced Deposition Plus Ar+ Milling

Published:2014-03-25 Issue:4 Volume:8 Page:3788-3795
ISSN:1936-0851
Container-title:ACS Nano
language:en
Short-container-title:ACS Nano

Author:

De Teresa José María¹²³,Córdoba Rosa²³

Affiliation:

1. Instituto de Ciencia de Materiales de Aragón (ICMA), Universidad de Zaragoza−CSIC, 50009 Zaragoza, Spain

2. Departamento de Física de la Materia Condensada, Universidad de Zaragoza, 50009 Zaragoza, Spain

3. Laboratorio de Microscopías Avanzadas (LMA), Instituto de Nanociencia de Aragón (INA), Universidad de Zaragoza, 50018 Zaragoza, Spain

Publisher

American Chemical Society (ACS)

Subject

General Physics and Astronomy,General Engineering,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/nn500525k

Reference37 articles.

1. Unconventional Methods for Fabricating and Patterning Nanostructures

2. Ordered magnetic nanostructures: fabrication and properties

3. Direct FIB fabrication and integration of “single nanopore devices” for the manipulation of macromolecules

4. Deposition and FIB direct patterning of nanowires and nanorings into suspended sheets of graphene

Cited by 27 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Additive nanofabrication using focused ion and electron beams;Encyclopedia of Condensed Matter Physics;2024

2. Magnetic Functionalization of Scanning Probes by Focused Electron Beam Induced Deposition Technology;Magnetochemistry;2021-10-13

3. Recent advances in focused ion beam nanofabrication for nanostructures and devices: fundamentals and applications;Nanoscale;2021

4. Comparison between Focused Electron/Ion Beam-Induced Deposition at Room Temperature and under Cryogenic Conditions;Micromachines;2019-11-21

5. Automated characterisation and analysis of large arrays of nanostructures fabricated at wafer scale;Precision Engineering;2019-11

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3