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Quantum Point Contact Microscopy

Published:2011-08-05 Issue:9 Volume:11 Page:3838-3843
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Zhang Yong-hui¹²,Wahl Peter¹,Kern Klaus¹³

Affiliation:

1. Max-Planck-Institut für Festkörperforschung, Heisenbergstrasse 1, 70569 Stuttgart, Germany

2. Department of Physics, Tsinghua University, Beijing 100084, China

3. Institut de Physique de la Matière Condensée, Ecole Polytechnique Fédérale de Lausanne (EPFL), CH-1015 Lausanne, Switzerland

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/nl201912u

Reference28 articles.

1. Tunneling through a controllable vacuum gap

2. Surface Studies by Scanning Tunneling Microscopy

3. Subatomic Features on the Silicon (111)-(7×7) Surface Observed by Atomic Force Microscopy

4. Chemical identification of individual surface atoms by atomic force microscopy

5. Scanning tunneling microscopy

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