Local Disordering in the Amorphous Network of a Solution-Processed Indium Tin Oxide Thin Film-Reference-Cited by-同舟云学术

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Local Disordering in the Amorphous Network of a Solution-Processed Indium Tin Oxide Thin Film

Published:2022-05-10 Issue:22 Volume:14 Page:25620-25628
ISSN:1944-8244
Container-title:ACS Applied Materials & Interfaces
language:en
Short-container-title:ACS Appl. Mater. Interfaces

Author:

Seo Hyunjeong¹,Kim Byeongsoo¹,Lee Keun Ho²,Chae Soosang³^ORCID,Jung Jongjin¹

Affiliation:

1. Department of Chemistry, Hannam University, Daejeon 34054, Korea

2. Raphas R&D Centre, Raphas Co. Ltd., Seoul 07793 Korea

3. Institute of Physical Chemistry and Polymer Physics, IPF─Leibniz-Institut für Polymerforschung Dresden e.V., Dresden 01069, Germany

Funder

National Research Foundation of Korea

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsami.2c01482

Reference32 articles.

1. Electronic Structure of Low‐Temperature Solution‐Processed Amorphous Metal Oxide Semiconductors for Thin‐Film Transistor Applications

2. Oxide Semiconductor Thin-Film Transistors: A Review of Recent Advances

3. Research Advances of Amorphous Metal Oxides in Electrochemical Energy Storage and Conversion

4. Room-temperature fabrication of transparent flexible thin-film transistors using amorphous oxide semiconductors

5. Linear topology in amorphous metal oxide electrochromic networks obtained via low-temperature solution processing

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Research on visual sensitivity characteristics of amorphous silicon photocells;Optoelectronics Letters;2024-05-30

2. Monitoring the Electrochemical Failure of Indium Tin Oxide Electrodes via Operando Ellipsometry Complemented by Electron Microscopy and Spectroscopy;ACS Applied Materials & Interfaces;2024-02-07

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