Engineering of Oxidized Line Defects on CVD-Grown MoS<sub>2</sub> Flakes-Reference-Cited by-同舟云学术

Engineering of Oxidized Line Defects on CVD-Grown MoS₂ Flakes

Published:2022-10-07 Issue:41 Volume:14 Page:47288-47299
ISSN:1944-8244
Container-title:ACS Applied Materials & Interfaces
language:en
Short-container-title:ACS Appl. Mater. Interfaces

Author:

Ma Xinli¹,Zhang Jinxi¹,Sun Yang¹,Wu Chen¹,Geng Guangyu¹,Zhang Jing¹,Wu Enxiu¹^ORCID,Xu Linyan¹,Wu Sen¹,Hu Xiaodong¹,Liu Jing¹^ORCID

Affiliation:

1. State Key Laboratory of Precision Measurement Technology and Instruments, School of Precision Instruments and Optoelectronics Engineering, Tianjin University, No. 92 Weijin Road, Tianjin300072, China

Funder

Ministry of Science and Technology of the People's Republic of China

National Natural Science Foundation of China

Higher Education Discipline Innovation Project

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsami.2c14200

Reference54 articles.

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3. Recent advances in controlled synthesis of two-dimensional transition metal dichalcogenides via vapour deposition techniques

4. Versatile Crystal Structures and (Opto)electronic Applications of the 2D Metal Mono‐, Di‐, and Tri‐Chalcogenide Nanosheets

5. Ultrasensitive photodetectors based on monolayer MoS2

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