In Situ Reflectometry and Diffraction Investigation of the Multiscale Structure of p-Type Polysilicon Passivating Contacts for c-Si Solar Cells

Author:

Morisset Audrey1ORCID,Famprikis Theodosios2ORCID,Haug Franz-Josef1,Ingenito Andrea3,Ballif Christophe13,Bannenberg Lars J.2ORCID

Affiliation:

1. Photovoltaics and Thin Film Electronics Laboratory, Institute of Electrical and Microengineering (IEM), Ecole Polytechnique Fédérale de Lausanne (EPFL), Maladière 71b, 2002 Neuchâtel, Switzerland

2. Department of Radiation Science and Technology, Faculty of Applied Sciences, Delft University of Technology, Mekelweg 15, 2629JB Delft, The Netherlands

3. Sustainable Energy Center, CSEM, Rue Jaquet-Droz 1, Neuchâtel, 2002, Switzerland

Funder

Bundesamt f?r Energie

H2020 Marie Sklodowska-Curie Actions

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

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