In Situ Reflectometry and Diffraction Investigation of the Multiscale Structure of p-Type Polysilicon Passivating Contacts for c-Si Solar Cells-Reference-Cited by-同舟云学术

In Situ Reflectometry and Diffraction Investigation of the Multiscale Structure of p-Type Polysilicon Passivating Contacts for c-Si Solar Cells

Published:2022-03-31 Issue:14 Volume:14 Page:16413-16423
ISSN:1944-8244
Container-title:ACS Applied Materials & Interfaces
language:en
Short-container-title:ACS Appl. Mater. Interfaces

Author:

Morisset Audrey¹^ORCID,Famprikis Theodosios²^ORCID,Haug Franz-Josef¹,Ingenito Andrea³,Ballif Christophe¹³,Bannenberg Lars J.²^ORCID

Affiliation:

1. Photovoltaics and Thin Film Electronics Laboratory, Institute of Electrical and Microengineering (IEM), Ecole Polytechnique Fédérale de Lausanne (EPFL), Maladière 71b, 2002 Neuchâtel, Switzerland

2. Department of Radiation Science and Technology, Faculty of Applied Sciences, Delft University of Technology, Mekelweg 15, 2629JB Delft, The Netherlands

3. Sustainable Energy Center, CSEM, Rue Jaquet-Droz 1, Neuchâtel, 2002, Switzerland

Funder

Bundesamt f?r Energie

H2020 Marie Sklodowska-Curie Actions

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsami.2c01225

Reference42 articles.

1. Terawatt-scale photovoltaics: Transform global energy