Piezoelectric Characterization of Individual Zinc Oxide Nanobelt Probed by Piezoresponse Force Microscope-Reference-Cited by-同舟云学术

Piezoelectric Characterization of Individual Zinc Oxide Nanobelt Probed by Piezoresponse Force Microscope

Published:2004-02-28 Issue:4 Volume:4 Page:587-590
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Zhao Min-Hua¹,Wang Zhong-Lin¹,Mao Scott X.¹

Affiliation:

1. Department of Mechanical Engineering, University of Pittsburgh, Pittsburgh, Pennsylvania 15261, and School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/nl035198a

Reference26 articles.

1. Characterization of sputtered ZnO thin film as sensor and actuator for diamond AFM probe

2. The fabrication of thin-film bulk acoustic wave resonators employing a ZnO/Si composite diaphragm structure using porous silicon layer etching

3. Nanobelts of Semiconducting Oxides

4. Field-Effect Transistors Based on Single Semiconducting Oxide Nanobelts

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