Measurement of Ambipolar Diffusion Coefficient of Photoexcited Carriers with Ultrafast Reflective Grating-Imaging Technique-Reference-Cited by-同舟云学术

Measurement of Ambipolar Diffusion Coefficient of Photoexcited Carriers with Ultrafast Reflective Grating-Imaging Technique

Published:2017-05-26 Issue:6 Volume:4 Page:1440-1446
ISSN:2330-4022
Container-title:ACS Photonics
language:en
Short-container-title:ACS Photonics

Author:

Chen Ke¹^ORCID,Sheehan Nathanial²,He Feng¹³,Meng Xianghai¹,Mason Sarah C.¹,Bank Seth R.²,Wang Yaguo¹³^ORCID

Affiliation:

1. Department of Mechanical Engineering, The University of Texas at Austin, Austin, Texas 78712, United States

2. Department of Electrical and Computer Engineering, Microelectronics Research Center, The University of Texas at Austin, Austin, Texas 78758, United States

3. Texas Materials Institute, The University of Texas at Austin, Austin, Texas 78712, United States

Funder

Division of Engineering Education and Centers

U.S. Department of Energy

Division of Materials Research

Northrop Grumman Corporation

Publisher

American Chemical Society (ACS)

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Biotechnology,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acsphotonics.7b00187

Reference31 articles.

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2. Band-Edge Electroabsorption in Quantum Well Structures: The Quantum-Confined Stark Effect

3. Many-body integer quantum Hall effect: Evidence for new phase transitions

4. Resonant tunneling through quantum wells at frequencies up to 2.5 THz

5. Multidimensional quantum well laser and temperature dependence of its threshold current

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