Near-Field Fano-Imaging of TE and TM Modes in Silicon Microrings-Reference-Cited by-同舟云学术

Near-Field Fano-Imaging of TE and TM Modes in Silicon Microrings

Published:2015-12-03 Issue:12 Volume:2 Page:1712-1718
ISSN:2330-4022
Container-title:ACS Photonics
language:en
Short-container-title:ACS Photonics

Author:

La China Federico¹²,Intonti Francesca¹²,Caselli Niccolò¹²,Lotti Francesco¹²,Sarti Francesco¹²,Vinattieri Anna¹²,Noury Adrien³,Le Roux Xavier³,Zhang Weiwei³,Cassan Eric³,Ramos Carlos Alonso³,Valdeiglesias Elena Durán³,Izard Nicolas³⁴,Vivien Laurent³,Gurioli Massimo¹²

Affiliation:

1. European Laboratory for Non-Linear Spectroscopy, 50019 Sesto Fiorentino (FI), Italy

2. Department of Physics and Astronomy, University of Florence, 50019 Sesto Fiorentino (FI), Italy

3. Institut d’Electronique Fondamentale (IEF), Université Paris 11, CNRS UMR 8622, F-91405 Orsay, France

4. Laboratoire Charles Coulomb, CNRS-UMR 5221, Université Montpellier, 34000 Montpellier, France

Funder

Seventh Framework Programme

Publisher

American Chemical Society (ACS)

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Biotechnology,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acsphotonics.5b00327

Reference42 articles.

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3. Vacuum Rabi splitting with a single quantum dot in a photonic crystal nanocavity

4. Strong coupling in a single quantum dot–semiconductor microcavity system

5. Quantum nature of a strongly coupled single quantum dot–cavity system

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