Vectorial Near-Field Imaging of Silicon Heterostructure Cavities in Air-Slot Waveguides
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Published:2017-04-01
Issue:7
Volume:29
Page:571-574
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ISSN:1041-1135
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Container-title:IEEE Photonics Technology Letters
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language:
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Short-container-title:IEEE Photon. Technol. Lett.
Author:
Caselli N.ORCID,
Hoang T. H. C.,
Le Roux X.,
Sarti F.,
Biccari F.,
La China F.,
Intonti F.,
Vinattieri A.,
Vivien L.,
Cassan E.,
Gurioli M.
Funder
FET Project CARTOON
Italian Ministry for Education
University and Research within the Futuro in Ricerca Program
Project DeLIGHTeD Protocollo
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials