Single Atomic Defect Conductivity for Selective Dilute Impurity Imaging in 2D Semiconductors

Author:

Vu Nam Thanh Trung1ORCID,Loh Leyi12ORCID,Chen Yuan3ORCID,Wu Qingyun4,Verzhbitskiy Ivan A.15ORCID,Watanabe Kenji6ORCID,Taniguchi Takashi7ORCID,Bosman Michel25ORCID,Ang Yee Sin4ORCID,Ang Lay Kee4ORCID,Trushin Maxim289,Eda Goki138ORCID

Affiliation:

1. Physics Department, National University of Singapore, Singapore 117551, Singapore

2. Department of Materials Science and Engineering, National University of Singapore, 9 Engineering Drive 1, Singapore 117575, Singapore

3. Chemistry Department, National University of Singapore, Singapore 117543, Singapore

4. Science, Mathematics, and Technology, Singapore University of Technology and Design (SUTD), Singapore 487372, Singapore

5. Institute of Materials Research and Engineering (IMRE), Agency for Science, Technology and Research (A*STAR), 2 Fusionopolis Way, Innovis #08-03, Singapore 138634, Singapore

6. Research Centre for Functional Materials, National Institute for Materials Science, Tsukuba 305-0047, Japan

7. International Centre for Materials Nanoarchitectonics, National Institute for Materials Science, Tsukuba 305-0047, Japan

8. Centre for Advanced 2D Materials, National University of Singapore, Singapore 117546, Singapore

9. Institute for Functional Intelligent Materials, National University of Singapore, Singapore 117544, Singapore

Funder

Ministry of Education - Singapore

National Research Foundation Singapore

Japan Society for the Promotion of Science

Publisher

American Chemical Society (ACS)

Subject

General Physics and Astronomy,General Engineering,General Materials Science

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