Probing the in-Plane Near-Field Enhancement Limit in a Plasmonic Particle-on-Film Nanocavity with Surface-Enhanced Raman Spectroscopy of Graphene

Author:

Liu Danjun1,Wu Tingting2,Zhang Qiang3,Wang Ximiao4,Guo Xuyun1ORCID,Su Yunkun4,Zhu Ye1,Shao Minhua5ORCID,Chen Huanjun4ORCID,Luo Yu2ORCID,Lei Dangyuan167ORCID

Affiliation:

1. Department of Applied Physics, The Hong Kong Polytechnic University, Hung Hom, 999077, Hong Kong, China

2. School of Electrical & Electronic Engineering, Nanyang Technological University, 50 Nanyang Avenue, 639798, Singapore

3. School of Materials Science and Engineering, Harbin Institute of Technology (Shenzhen), Shenzhen 518055, China

4. State Key Laboratory of Optoelectronic Materials and Technologies, Guangdong Province Key Laboratory of Display Material and Technology, School of Electronics and Information Technology, Sun Yat-sen University, Guangzhou 510275, China

5. Department of Chemical and Biological Engineering, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, 999077, Hong Kong, China

6. Shenzhen Research Institute, The Hong Kong Polytechnic University, Shenzhen 518057, China

7. Department of Materials Science and Engineering, City University of Hong Kong, 83 Tat Chee Avenue, Kowloon, 999077, Hong Kong, China

Funder

Research Grants Council, University Grants Committee

National Natural Science Foundation of China

Hong Kong Polytechnic University

Publisher

American Chemical Society (ACS)

Subject

General Physics and Astronomy,General Engineering,General Materials Science

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