Imaging Negative Charge around Single Vanadium Dopant Atoms in Monolayer Tungsten Diselenide Using 4D Scanning Transmission Electron Microscopy-Reference-Cited by-同舟云学术

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Imaging Negative Charge around Single Vanadium Dopant Atoms in Monolayer Tungsten Diselenide Using 4D Scanning Transmission Electron Microscopy

Published:2024-08-15 Issue:34 Volume:18 Page:23354-23364
ISSN:1936-0851
Container-title:ACS Nano
language:en
Short-container-title:ACS Nano

Author:

Dosenovic Djordje¹^ORCID,Dechamps Samuel¹²,Sharma Kshipra¹,Rouviere Jean-Luc¹,Lu Yiran³^ORCID,den Hertog Martien Ilse³^ORCID,Genovese Luigi¹^ORCID,Dubois Simon Mutien-Marie²,Charlier Jean-Christophe²,Jamet Matthieu⁴^ORCID,Marty Alain⁴,Okuno Hanako¹^ORCID

Affiliation:

1. Univ. Grenoble Alpes, CEA, IRIG-MEM, 38000 Grenoble, France

2. Institute of Condensed Matter and Nanosciences, Université catholique de Louvain (UCLouvain), 1348 Louvain-la-Neuve, Belgium

3. Univ. Grenoble Alpes, CNRS-Institut Néel, F-38000 Grenoble, France

4. Univ. Grenoble Alpes, CEA, CNRS, Grenoble INP, IRIG-SPINTEC, 38000 Grenoble, France

Funder

Agence Nationale de la Recherche

F?d?ration Wallonie-Bruxelles

H2020 Future and Emerging Technologies

Fonds De La Recherche Scientifique - FNRS

H2020 European Research Council

Publisher

American Chemical Society (ACS)

Link

https://pubs.acs.org/doi/pdf/10.1021/acsnano.4c06561

Reference57 articles.

1. 2D materials and van der Waals heterostructures

2. Electronics based on two-dimensional materials

3. Van der Waals heterostructures for spintronics and opto-spintronics

4. Two-dimensional materials prospects for non-volatile spintronic memories

5. Strategies, Status, and Challenges in Wafer Scale Single Crystalline Two-Dimensional Materials Synthesis

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