Tomography of a Probe Potential Using Atomic Sensors on Graphene

Author:

Wyrick Jonathan1ORCID,Natterer Fabian D.1,Zhao Yue123,Watanabe Kenji4ORCID,Taniguchi Takashi4,Cullen William G.1,Zhitenev Nikolai B.1,Stroscio Joseph A.1

Affiliation:

1. Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States

2. Maryland NanoCenter, University of Maryland, College Park, Maryland 20742, United States

3. Department of Physics, South University of Science and Technology of China, Shenzhen 518055, China

4. Advanced Materials Laboratory, National Institute for Materials Science, Tsukuba, Ibaraki 305-0044, Japan

Funder

Schweizerischer Nationalfonds zur Förderung der Wissenschaftlichen Forschung

National Institute of Standards and Technology

Center for Nanoscale Science and Technology

University of Maryland

National Academies of Sciences, Engineering, and Medicine

National Institute for Materials Science

Publisher

American Chemical Society (ACS)

Subject

General Physics and Astronomy,General Engineering,General Materials Science

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