Atomic Resolution Cryogenic 4D-STEM Imaging via Robust Distortion Correction-Reference-Cited by-同舟云学术

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Atomic Resolution Cryogenic 4D-STEM Imaging via Robust Distortion Correction

Published:2023-06-09 Issue:12 Volume:17 Page:11327-11334
ISSN:1936-0851
Container-title:ACS Nano
language:en
Short-container-title:ACS Nano

Author:

Smith Jacob¹²,Huang Zhennan²,Gao Wenpei¹^ORCID,Zhang Guannan³,Chi Miaofang²^ORCID

Affiliation:

1. Department of Materials Science and Engineering, North Carolina State University, Raleigh, North Carolina 27695, United States of America

2. Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States of America

3. Computer Science and Mathematics Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37830, United States of America

Funder

Basic Energy Sciences

Publisher

American Chemical Society (ACS)

Subject

General Physics and Astronomy,General Engineering,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsnano.2c12777

Reference27 articles.

1. Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond

2. Electron ptychography achieves atomic-resolution limits set by lattice vibrations

3. Electron ptychographic microscopy for three-dimensional imaging

4. Direct visualization of anionic electrons in an electride reveals inhomogeneities

5. Polarization fluctuation of BaTiO3 at unit cell level mapped by four-dimensional scanning transmission electron microscopy

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Atomic resolution scanning transmission electron microscopy at liquid helium temperatures for quantum materials;Ultramicroscopy;2024-12

2. Stability Requirements for Ultra-Cold Atomic Imaging: Opportunities in 4D-STEM;Microscopy and Microanalysis;2024-07

3. C₆₀ and Derivatives Boost Electrocatalysis and Photocatalysis: Electron Buffers to Heterojunctions;Advanced Energy Materials;2023-10-27

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