Metal-Assisted Secondary Ion Mass Spectrometry Using Atomic (Ga+, In+) and Fullerene Projectiles-Reference-Cited by-同舟云学术

Metal-Assisted Secondary Ion Mass Spectrometry Using Atomic (Ga+, In+) and Fullerene Projectiles

Published:2007-04-07 Issue:10 Volume:79 Page:3673-3689
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

Delcorte A.¹,Yunus S.¹,Wehbe N.¹,Nieuwjaer N.¹,Poleunis C.¹,Felten A.¹,Houssiau L.¹,Pireaux J.-J.¹,Bertrand P.¹

Affiliation:

1. PCPM, Université Catholique de Louvain, Croix du Sud 1, B-1348 Louvain-la-Neuve, Belgium, and LISE, Facultés Universitaires Notre-Dame de la Paix, Namur, Belgium

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/ac062406l

Reference53 articles.

1. Improvements in SIMS continue

2. keV fullerene interaction with hydrocarbon targets: Projectile penetration, damage creation and removal

3. Secondary ion mass spectrometry using cluster primary ion beams

4. A C60 Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry: Its Development and Secondary Ion Yield Characteristics

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