keV fullerene interaction with hydrocarbon targets: Projectile penetration, damage creation and removal
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference21 articles.
1. A C60 Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry: Its Development and Secondary Ion Yield Characteristics
2. Cluster primary ion bombardment of organic materials
3. Stretching the limits of static SIMS with C60+
4. The Magic of Cluster SIMS
5. Microscopic Insights into the Sputtering of Ag{111} Induced by C60 and Ga Bombardment
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