Exploring Topological Defects in Epitaxial BiFeO3 Thin Films

Author:

Vasudevan Rama K.1,Chen Yi-Chun2,Tai Hsiang-Hua2,Balke Nina3,Wu Pingping4,Bhattacharya Saswata4,Chen L. Q.4,Chu Ying-Hao5,Lin I-Nan6,Kalinin Sergei V.3,Nagarajan Valanoor1

Affiliation:

1. School of Materials Science and Engineering, University of New South Wales, Sydney 2052, Australia

2. Department of Physics, National Cheng Kung University, No.1, University Road, Tainan City 701, Taiwan R.O.C.

3. The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States

4. Department of Materials Science and Engineering, Penn State University, University Park, Pennsylvania 16802, United States

5. Department of Materials Science and Engineering, National Chiao Tung University, Hsinchu 30010, Taiwan

6. Department of Physics, Tamkang University, Tamsui 251, Taiwan

Publisher

American Chemical Society (ACS)

Subject

General Physics and Astronomy,General Engineering,General Materials Science

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