High Lateral Resolution Imaging with Sharpened Tip of Multi-Walled Carbon Nanotube Scanning Probe
Author:
Affiliation:
1. Center for Nanotechnology, NASA Ames Research Center, MS 229-1, Moffett Field, California 94035
Publisher
American Chemical Society (ACS)
Subject
Materials Chemistry,Surfaces, Coatings and Films,Physical and Theoretical Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/jp0361529
Reference18 articles.
1. Nanotubes as nanoprobes in scanning probe microscopy
2. Carbon nanotube scanning probe for profiling of deep-ultraviolet and 193 nm photoresist patterns
3. Carbon nanotube tip probes: stability and lateral resolution in scanning probe microscopy and application to surface science in semiconductors
4. Covalently-Functionalized Single-Walled Carbon Nanotube Probe Tips for Chemical Force Microscopy
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