Carbon nanotube tip probes: stability and lateral resolution in scanning probe microscopy and application to surface science in semiconductors-Reference-Cited by-同舟云学术

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Carbon nanotube tip probes: stability and lateral resolution in scanning probe microscopy and application to surface science in semiconductors

Published:2001-08-28 Issue:3 Volume:12 Page:363-367
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Nguyen Cattien V,Chao Kuo-Jen,Stevens Ramsey M D,Delzeit Lance,Cassell Alan,Han Jie,Meyyappan M

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Link

http://stacks.iop.org/0957-4484/12/i=3/a=326/pdf

Reference11 articles.

1. Helical microtubules of graphitic carbon

2. Nanotubes as nanoprobes in scanning probe microscopy

3. Direct Growth of Single-Walled Carbon Nanotube Scanning Probe Microscopy Tips

4. Microprocess for fabricating carbon-nanotube probes of a scanning probe microscope

5. Carbon nanotubes as probes for atomic force microscopy

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