Microprocess for fabricating carbon-nanotube probes of a scanning probe microscope-Reference-Cited by-同舟云学术

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Microprocess for fabricating carbon-nanotube probes of a scanning probe microscope

Published:2000 Issue:2 Volume:18 Page:661
ISSN:0734-211X
Container-title:Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
language:en
Short-container-title:J. Vac. Sci. Technol. B

Author:

Nakayama Yoshikazu,Nishijima Hidehiro,Akita Seiji,Hohmura Ken I.,Yoshimura Shige H.,Takeyasu Kunio

Publisher

American Vacuum Society

Subject

General Engineering

Cited by 46 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Controlled optical near-field growth of individual free-standing well-oriented carbon nanotubes, application for scattering SNOM/AFM probes;Nanophotonics;2022-10-17

2. General algorithm and method for scanning a via hole by using critical-dimension atomic force microscopy;Journal of the Korean Physical Society;2014-06

3. Engineering and Applications of Carbon Materials;Materials Science and Engineering of Carbon: Fundamentals;2014

4. Carbon Nanotube Tips in Atomic Force Microscopy with Applications to Imaging in Liquid;Atomic Force Microscopy in Liquid;2012-04-10

5. Strategies for Post-Synthesis Alignment and Immobilization of Carbon Nanotubes;Advanced Materials;2010-12-22

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