Interfacial Defect-Mediated Near-Infrared Silicon Photodetection with Metal Oxides
Author:
Affiliation:
1. Department of Electrical and Computer Engineering, University of California, Davis, California 95616, United States
Funder
Office of Naval Research
Division of Electrical, Communications and Cyber Systems
Publisher
American Chemical Society (ACS)
Subject
General Materials Science
Link
https://pubs.acs.org/doi/pdf/10.1021/acsami.9b14953
Reference49 articles.
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5. Towards the intermediate band
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