Scalable hot carrier–assisted silicon photodetector array based on ultrathin gold film

Author:

Kim Geunpil12ORCID,Kim Hyebi12,Jeon Young-Uk12,Kim In Soo13ORCID,Kim Soo Jin2ORCID,Kim Sangsik4ORCID,Kim Jongbum1ORCID

Affiliation:

1. Nanophotonics Research Center, Korea Institute of Science and Technology (KIST) , Seoul , 02792 , Republic of Korea

2. School of Electrical Engineering, Korea University , 145, Anam-ro, Seongbuk-gu , Seoul , 02841 , Republic of Korea

3. KIST-SKKU Carbon-Neutral Research Center, Sungkyunkwan University (SKKU) , Suwon 16419 , Republic of Korea

4. School of Electrical Engineering, Korea Advanced Institute of Science and Technology , Daejeon 34141 , Republic of Korea

Abstract

Abstract Silicon (Si) offers cost-effective production and convenient on-chip integration for photodetection due to its well-established CMOS technology. However, the indirect bandgap of Si inherently limits its detection efficiency in the near-infrared (NIR) regime. Here, we propose a strategy to achieve high NIR photoresponse in Si by introducing a strong light-absorbing ultrathin gold (Au) film to generate hot carriers. Using a 4.6 nm thick-Au film deposited on Si, we achieved photoresponsivity of 1.6 mA/W at 1310 nm under zero-bias conditions, and rapid temporal responses of 7.5 and 8 μs for rise and fall times, respectively, comparable to germanium (Ge) photodiodes. By utilizing an ultrathin (<6 nm) Au film as the light-detecting layer and thicker (>100 nm) Au film as electrodes, we introduce a unique approach to design a photodiode array based on a single metal (Au) platform. Comparative analysis with a commercial beam profiler image validates the performance of our designed array. This work presents an efficient strategy for manufacturing cost-effective and scalable NIR photodetector arrays, which eliminates the need for additional insulator layers.

Publisher

Walter de Gruyter GmbH

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