Microstructural, Optical, and Electrical Properties of SnO Thin Films Prepared on Quartz via a Two-Step Method-Reference-Cited by-同舟云学术

Microstructural, Optical, and Electrical Properties of SnO Thin Films Prepared on Quartz via a Two-Step Method

Published:2010-03-22 Issue:4 Volume:2 Page:1060-1065
ISSN:1944-8244
Container-title:ACS Applied Materials & Interfaces
language:en
Short-container-title:ACS Appl. Mater. Interfaces

Author:

Liang Ling Yan¹,Liu Zhi Min¹,Cao Hong Tao¹,Pan Xiao Qin¹

Affiliation:

1. Division of Functional Materials and Nano Devices, Ningbo Institute of Material Technology and Engineering, Chinese Academy of Sciences, Ningbo 315201, People’s Republic of China, and Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/am900838z

Reference45 articles.

1. Calculated static and dynamic properties of β-Sn and Sn-O compounds

2. The tin oxide gas sensor and its applications

3. Highly efficient photon-to-electron conversion with mercurochrome-sensitized nanoporous oxide semiconductor solar cells

4. Transparent thin-film transistor with self-assembled nanocrystals

5. Synthesis and characterisation of metal suboxides for gas sensors

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