Phase Identification and Ordered Vacancy Imaging in Epitaxial Metallic Ta2N Thin Films-Reference-Cited by-同舟云学术

Phase Identification and Ordered Vacancy Imaging in Epitaxial Metallic Ta2N Thin Films

Published:2021-03-05 Issue:10 Volume:13 Page:12575-12580
ISSN:1944-8244
Container-title:ACS Applied Materials & Interfaces
language:en
Short-container-title:ACS Appl. Mater. Interfaces

Author:

Lang Andrew C.¹^ORCID,Katzer D. Scott²,Nepal Neeraj²^ORCID,Meyer David J.²,Stroud Rhonda M.³^ORCID

Affiliation:

1. American Society for Engineering Education Postdoctoral Fellow, U.S. Naval Research Laboratory, Washington, District of Columbia 20375, United States

2. Electronics Science and Technology Division, U.S. Naval Research Laboratory, Washington, District of Columbia 20375, United States

3. Materials Science and Technology Division, U.S. Naval Research Laboratory, Washington, District of Columbia 20375, United States

Funder

Office of Naval Research

American Society for Engineering Education

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsami.0c22244

Reference41 articles.

1. GaN/NbN epitaxial semiconductor/superconductor heterostructures

2. Superconductor‐normal‐superconductor junctions for programmable voltage standards

3. A review of Josephson comparison results

4. Epitaxial metallic β-Nb2N films grown by MBE on hexagonal SiC substrates

5. Characterization of molecular beam epitaxy grown β-Nb2N films and AlN/β-Nb2N heterojunctions on 6H-SiC substrates

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