Helium Ion Microscopy with Secondary Ion Mass Spectrometry for Nanoscale Chemical Imaging and Analysis of Polyolefins-Reference-Cited by-同舟云学术

Helium Ion Microscopy with Secondary Ion Mass Spectrometry for Nanoscale Chemical Imaging and Analysis of Polyolefins

Published:2021-06-16 Issue:7 Volume:3 Page:3478-3484
ISSN:2637-6105
Container-title:ACS Applied Polymer Materials
language:en
Short-container-title:ACS Appl. Polym. Mater.

Author:

Ovchinnikova Olga S.¹^ORCID,Borodinov Nikolay¹^ORCID,Trofimov Artem A.¹²,King Steven T.¹,Lorenz Matthias¹^ORCID,Lamberti William³,Abmayr David⁴,Ievlev Anton V.¹^ORCID

Affiliation:

1. Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States

2. Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States

3. Exxon Mobil Research and Engineering Company, Clinton, New Jersey 08809, United States

4. Exxon Mobil Chemical Company, Baytown, Texas 77520, United States

Funder

ExxonMobil Research and Engineering Company

Publisher

American Chemical Society (ACS)

Subject

Organic Chemistry,Polymers and Plastics,Process Chemistry and Technology

Link

https://pubs.acs.org/doi/pdf/10.1021/acsapm.1c00407

Reference33 articles.

1. Environmental analysis of plastic production processes: Comparing petroleum-based polypropylene and polyethylene with biologically-based poly-β-hydroxybutyric acid using life cycle analysis

2. Mass Spectrometry of Polymers and Polymer Surfaces

3. 3D ToF-SIMS Imaging of Polymer Multilayer Films Using Argon Cluster Sputter Depth Profiling

4. An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

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