Epitaxial Growth and Structural Characterization of Ceria Deposited by Atomic Layer Deposition on High-Surface Porous Yttria-Stabilized Zirconia Thin Films-Reference-Cited by-同舟云学术

Epitaxial Growth and Structural Characterization of Ceria Deposited by Atomic Layer Deposition on High-Surface Porous Yttria-Stabilized Zirconia Thin Films

Published:2020-02-21 Issue:4 Volume:20 Page:2194-2201
ISSN:1528-7483
Container-title:Crystal Growth & Design
language:en
Short-container-title:Crystal Growth & Design

Author:

Zscherp Mario F.,Glaser Jonas,Becker Celina¹,Beyer Andreas¹,Cop Pascal,Schörmann Jörg,Volz Kerstin¹,Elm Matthias T.^ORCID

Affiliation:

1. Wissenschaftliches Zentrum für Materialwissenschaften, Philipps University, Marburg, Germany

Funder

Bundesministerium f?r Bildung und Forschung

Publisher

American Chemical Society (ACS)

Subject

Condensed Matter Physics,General Materials Science,General Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.cgd.9b01112

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