Molecular Depth Profiling with Cluster Secondary Ion Mass Spectrometry and Wedges
Author:
Affiliation:
1. Chemistry Department, Pennsylvania State University, 104 Chemistry Building, University Park, Pennsylvania 16802, and Faculty of Physics, University Duisburg-Essen, 47048 Duisburg, Germany
Publisher
American Chemical Society (ACS)
Subject
Analytical Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/ac902313q
Reference15 articles.
1. Depth Profiling of 4-Acetamindophenol-Doped Poly(lactic acid) Films Using Cluster Secondary Ion Mass Spectrometry
2. Molecular Depth Profiling with Cluster Ion Beams
3. Three-dimensional depth profiling of molecular structures
4. Depth Resolution During C60+ Profiling of Multilayer Molecular Films
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