Contamination-Free Transmission Electron Microscopy for High-Resolution Carbon Elemental Mapping of Polymers-Reference-Cited by-同舟云学术

Contamination-Free Transmission Electron Microscopy for High-Resolution Carbon Elemental Mapping of Polymers

Published:2009-04-29 Issue:5 Volume:3 Page:1297-1304
ISSN:1936-0851
Container-title:ACS Nano
language:en
Short-container-title:ACS Nano

Author:

Horiuchi Shin¹,Hanada Takeshi²,Ebisawa Masaharu²,Matsuda Yasuhiro³,Kobayashi Motoyasu³,Takahara Atsushi³

Affiliation:

1. Nanotechnology Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1, Higashi, Tsukuba, Ibaraki 305-8565, Japan

2. Consulting Zero Loss Imaging, Inc., 1-33-31, Shinkoji, Machida, Tokyo 195-0057, Japan

3. Institute for Materials Chemistry and Engineering, Kyushu University, 744 Motooka Nishi-ku, Fukuoka 819-0395, Japan

Publisher

American Chemical Society (ACS)

Subject

General Physics and Astronomy,General Engineering,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/nn9001598

Reference27 articles.

1. Element-selective imaging of atomic columns in a crystal using STEM and EELS

2. Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy

3. Reimer, L.Transmission Electron Microscopy;Springer:Heidelberg, Berlin, Germany, 1997; pp488−494.

4. Low-dose performance of parallel-beam nanodiffraction

5. Diffuse Polymer Interfaces in Lobed Nanoemulsions Preserved in Aqueous Media

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