Controlled Insertion of Planar Defect in Inverse Opals for Anticounterfeiting Applications-Reference-Cited by-同舟云学术

Controlled Insertion of Planar Defect in Inverse Opals for Anticounterfeiting Applications

Published:2017-12-05 Issue:49 Volume:9 Page:43098-43104
ISSN:1944-8244
Container-title:ACS Applied Materials & Interfaces
language:en
Short-container-title:ACS Appl. Mater. Interfaces

Author:

Heo Yongjoon¹,Lee Su Yeon²^ORCID,Kim Ji-Won¹,Jeon Tae Yoon¹,Kim Shin-Hyun¹^ORCID

Affiliation:

1. Department of Chemical and Biomolecular Engineering (BK21+ Program), Korea Advanced Institute of Science and Technology (KAIST), Daejeon 34141, Republic of Korea

2. Division of Advanced Materials, Korea Research Institute of Chemical Technology (KRICT), Daejeon 34114, Republic of Korea

Funder

National Research Foundation of Korea

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsami.7b13946

Reference49 articles.

1. Photonic crystal properties of packed submicrometric SiO2 spheres

2. From Opals to Optics: Colloidal Photonic Crystals

3. Optical Properties of Inverse Opal Photonic Crystals

4. Photonic band gap of opals and inverse opals

5. Self-assembled colloidal structures for photonics

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