Charge Transport and the Nature of Traps in Oxygen Deficient Tantalum Oxide-Reference-Cited by-同舟云学术

Charge Transport and the Nature of Traps in Oxygen Deficient Tantalum Oxide

Published:2018-01-22 Issue:4 Volume:10 Page:3769-3775
ISSN:1944-8244
Container-title:ACS Applied Materials & Interfaces
language:en
Short-container-title:ACS Appl. Mater. Interfaces

Author:

Gritsenko Vladimir A.¹²³,Perevalov Timofey V.¹²^ORCID,Voronkovskii Vitalii A.¹,Gismatulin Andrei A.¹^ORCID,Kruchinin Vladimir N.¹,Aliev Vladimir Sh.¹,Pustovarov Vladimir A.⁴,Prosvirin Igor P.⁵^ORCID,Roizin Yakov⁶

Affiliation:

1. Rzhanov Institute of Semiconductor Physics SB RAS, 13 Lavrentiev Avenue, 630090, Novosibirsk, Russia

2. Novosibirsk State University, 2 Pirogov Street, 630090, Novosibirsk, Russia

3. Novosibirsk State Technical University, 20 Prospekt K. Marksa, 630073, Novosibirsk, Russia

4. Experimental Physics Department, Ural Federal University, 19 Mira Strasse, 620002 Ekaterinburg, Russia

5. Boreskov Institute of Catalysis SB RAS, 5 Lavrentiev Avenue, 630090, Novosibirsk, Russia

6. TowerJazz, P.O. Box 619, Migdal HaEmek 23105, Israel

Funder

Russian Science Foundation

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsami.7b16753

Reference52 articles.

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