Electric Field Stiffening Effect in c-Oriented Aluminum Nitride Piezoelectric Thin Films-Reference-Cited by-同舟云学术

Electric Field Stiffening Effect in c-Oriented Aluminum Nitride Piezoelectric Thin Films

Published:2018-01-02 Issue:2 Volume:10 Page:1819-1827
ISSN:1944-8244
Container-title:ACS Applied Materials & Interfaces
language:en
Short-container-title:ACS Appl. Mater. Interfaces

Author:

Chen Cong¹,Shang Zhengguo¹,Gong Jia¹,Zhang Feng¹,Zhou Hong¹,Tang Bin²,Xu Yi¹,Zhang Chi³^ORCID,Yang Ya³^ORCID,Mu Xiaojing¹^ORCID

Affiliation:

1. Key Laboratory of Optoelectronic Technology & Systems, Ministry of Education and International R & D Center of Micro-Nano Systems and New Materials Technology, Chongqing University, Chongqing 400044, P. R. China

2. Institute of Electronic Engineering, China Academy of Engineering Physics, Mianyang 621900, Sichuan, P. R. China

3. Beijing Institute of Nanoenergy and Nanosystems, Chinese Academy of Sciences, Beijing 100083, P. R. China

Funder

Ministry of Education of the People's Republic of China

Ministry of Science and Technology of the People's Republic of China

National Natural Science Foundation of China

?Thousands talents? program for the pioneer researcher and his innovation team

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsami.7b14759

Reference31 articles.

1. Scanning Probe Study on the Piezotronic Effect in ZnO Nanomaterials and Nanodevices

2. Performance and service behavior in 1-D nanostructured energy conversion devices

3. Electrical properties of AlN thin films deposited at low temperature on Si(100)

4. Ultrafine AIN and Al-AlN powders: Preparation by DC Arc plasma and thermal treatment

5. Structural properties and nanoindentation of AlN films by a filtered cathodic vacuum arc at low temperature

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