Direct Probing of Cross-Plane Thermal Properties of Atomic Layer Deposition Al2O3/ZnO Superlattice Films with an Improved Figure of Merit and Their Cross-Plane Thermoelectric Generating Performance-Reference-Cited by-同舟云学术

Direct Probing of Cross-Plane Thermal Properties of Atomic Layer Deposition Al2O3/ZnO Superlattice Films with an Improved Figure of Merit and Their Cross-Plane Thermoelectric Generating Performance

Published:2018-12-03 Issue:51 Volume:10 Page:44472-44482
ISSN:1944-8244
Container-title:ACS Applied Materials & Interfaces
language:en
Short-container-title:ACS Appl. Mater. Interfaces

Author:

Park No-Won¹,Lee Won-Yong¹,Yoon Yo-Seop¹,Ahn Jay-Young¹,Lee Jung-Hoon²,Kim Gil-Sung¹,Kim Tae Geun³^ORCID,Choi Chel-Jong⁴,Park Jin-Seong²^ORCID,Saitoh Eiji,Lee Sang-Kwon¹^ORCID

Affiliation:

1. Department of Physics, Chung-Ang University, Seoul 06974, Republic of Korea

2. Division of Materials Science and Engineering, Hanyang University, Seoul 04763, Republic of Korea

3. School of Electrical Engineering, Korea University, Seoul 02841, Republic of Korea

4. Department of Semiconductor Science and Technology, Chonbuk National University, Jeonju 54896, Republic of Korea

Funder

National Research Foundation of Korea

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsami.8b15997

Reference53 articles.

1. Optimization of the thermoelectric figure of merit in the conducting polymer poly(3,4-ethylenedioxythiophene)

2. Superlattice-based thin-film thermoelectric modules with high cooling fluxes

3. On-chip cooling by superlattice-based thin-film thermoelectrics

4. Silicon nanowires as efficient thermoelectric materials

5. Synergy in a superlattice

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