Supported Two-Dimensional Materials under Ion Irradiation: The Substrate Governs Defect Production-Reference-Cited by-同舟云学术

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Supported Two-Dimensional Materials under Ion Irradiation: The Substrate Governs Defect Production

Published:2018-08-17 Issue:36 Volume:10 Page:30827-30836
ISSN:1944-8244
Container-title:ACS Applied Materials & Interfaces
language:en
Short-container-title:ACS Appl. Mater. Interfaces

Author:

Kretschmer Silvan¹^ORCID,Maslov Mikhail¹²,Ghaderzadeh Sadegh¹,Ghorbani-Asl Mahdi¹^ORCID,Hlawacek Gregor¹^ORCID,Krasheninnikov Arkady V.¹³^ORCID

Affiliation:

1. Institute of Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf, 01328 Dresden, Germany

2. Moscow Institute of Physics and Technology, 141700 Dolgoprudny, Russia

3. Department of Applied Physics, Aalto University, 00076 Aalto, Finland

Funder

Deutsche Forschungsgemeinschaft

Suomen Akatemia

Horizon 2020 Framework Programme

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsami.8b08471

Reference52 articles.

1. Ion-Solid Interactions

2. Materials Science with Ion Beams

3. The use of a Ga+focused ion beam to modify graphene for device applications

4. Etching of Graphene Devices with a Helium Ion Beam

5. Sub-10nm patterning by focused He-ion beam milling for fabrication of downscaled graphene nano devices

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