Electrical Characterization of Bismuth Sulfide Nanowire Arrays by Conductive Atomic Force Microscopy-Reference-Cited by-同舟云学术

Electrical Characterization of Bismuth Sulfide Nanowire Arrays by Conductive Atomic Force Microscopy

Published:2008-11-14 Issue:49 Volume:112 Page:19680-19685
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Birjukovs Pavels¹,Petkov Nikolay¹,Xu Ju¹,Svirksts Janis¹,Boland John J.¹,Holmes Justin D.¹,Erts Donats¹

Affiliation:

1. Institute of Chemical Physics and Department of Chemistry, University of Latvia, Raina Blvd. 19, LV1586 Riga, Latvia, Materials and Supercritical Fluids Group, Department of Chemistry and the Tyndall National Institute, University College Cork, Cork, Ireland, and Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN), Trinity College Dublin, Dublin 2, Ireland

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/jp805422k

Reference34 articles.

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3. Surface Chemistry and Electrical Properties of Germanium Nanowires

4. Germanium nanowire field-effect transistors with SiO2 and high-κ HfO2 gate dielectrics

5. Indium phosphide nanowires as building blocks for nanoscale electronic and optoelectronic devices

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