Direct Observation of the Outermost Surfaces of Mesoporous Silica Thin Films by High Resolution Ultralow Voltage Scanning Electron Microscopy-Reference-Cited by-同舟云学术

Direct Observation of the Outermost Surfaces of Mesoporous Silica Thin Films by High Resolution Ultralow Voltage Scanning Electron Microscopy

Published:2017-02-20 Issue:9 Volume:33 Page:2148-2156
ISSN:0743-7463
Container-title:Langmuir
language:en
Short-container-title:Langmuir

Author:

Kobayashi Maho¹,Susuki Kyoka¹,Otsuji Haruo²,Sakuda Yusuke³,Asahina Shunsuke³,Kikuchi Naoki³,Kanazawa Toshiyuki³,Kuroda Yoshiyuki⁴,Wada Hiroaki¹,Shimojima Atsushi¹,Kuroda Kazuyuki¹²^ORCID

Affiliation:

1. Department of Applied Chemistry, Faculty of Science and Engineering, Waseda University, 3-4-1 Ohkubo, Shinjuku-ku, Tokyo 169-8555, Japan

2. Kagami Memorial Research Institute for Materials Science and Technology, Waseda University, 2-8-26 Nishiwaseda, Shinjuku-ku, Tokyo 169-0051, Japan

3. JEOL Ltd. SM Business Unit, 3-1-2 Musashino, Akishima-shi, Tokyo 196-8558, Japan

4. Waseda Institute for Advanced Study, 1-6-1 Nishiwaseda, Shinjuku-ku, Tokyo 169-8050, Japan

Funder

Japan Society for the Promotion of Science

Japan Chemical Industry Association

Publisher

American Chemical Society (ACS)

Subject

Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.langmuir.6b04511

Reference25 articles.

1. Mesoporous thin films: properties and applications

2. Design, Synthesis, and Properties of Inorganic and Hybrid Thin Films Having Periodically Organized Nanoporosity

3. Fundamentals of Mesostructuring Through Evaporation-Induced Self-Assembly

4. Order−Disorder in Self-Assembled Mesostructured Silica Films: A Concepts Review

5. How to exploit the full potential of the dip-coating process to better control film formation

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